Deuterium implantation in palladium

Abstract

Depth profiling of implanted deuterium is experimentally determined using the technique of analysing the spectra of tritons produced from the D(d,p)T reaction. Two sources of error may be present, affecting the accuracy of the analysis. The first involves multiple scattering effects which become very dominant at low deuteron energies, below 70KeV, causing an over-estimation in the deuterium loadings below this particular incident deuteron energy. An experimental method of correction is given and a theoretical analysis (involving a simplified multiple scattering model) is discussed, providing a comparative correctional method. Secondly, problems associated with enhanced diffusion are anticipated. An experimental approach is taken to estimate the effects of diffusion on the loading profiles.